Presentation Information

[Th-1A-03]Body Diode Reliability Studies of SiC-MOSFETs Containing Micropipe Defects

*Lucile C. Teague Sheridan1, Callie M. Woods1, Michael Pannone1, Ayan Biswas1, Brett Hull1, Jared Langan1, Keith Boom1, Keval Patel1, Don Gajewski1, Elif Balkas1 (1. Wolfspeed, Inc (USA))