[Th-1A] Reliability

11:20 AM - 11:40 AM JST(2:20 AM - 2:40 AM UTC)

[Th-1A-05] High-Dose Total Ionizing Dose Effects in Commercial 4H-SiC MOSFETs and Alternative Power Devices

Virendra Kotagama¹, Sami Kibal², Rachel A Oliver², Arne B Renz¹, Vishal A Shah¹, Marina Antoniou¹, *Peter M Gammon¹ (1. University of Warwick (UK), 2. University of Cambridge (UK))