Presentation Information

10:40 AM - 11:00 AM JST(1:40 AM - 2:00 AM UTC)

[Th-1B-03]Quantitative Evaluation of Stacking Fault-Induced Non-Linear Resistance in Schottky Barrier Diodes

Do Yeon Park^1,2, *Moonkyong Na¹, Taswar Iqbal³, Soon-Ku Hong³, Sung Yun Woo², Hyundon Jung⁴, Dohyung Kim⁴, In Ho Kang¹, Jae Hwa Seo¹, Byoung Hoon Noh⁵, Kyung Seok Oh⁵ (1. Korea Electrotech. Res. Inst. (Korea), 2. Kyungpook National Univ. (Korea), 3. Chungnam National Univ. (Korea), 4. Horiba STEC Korea (Korea), 5. ARCHE Co., Ltd. (Korea))

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