Presentation Information
[Th-1B-06]Analysis of Deep-Level Effects on Switching Characteristics of SJ-MOSFETs
*Takeshi Tawara1, Kensuke Taknaka2, Shinichiro Matsunaga1, Shinsuke Harada1 (1. National Inst. of Advanced Industrial Science and Technology (AIST) (Japan), 2. Fuji Electric Corp., Ltd. (Japan))
