[Th-2A] Interface Charge

2:10 PM - 2:30 PM JST(5:10 AM - 5:30 AM UTC)

[Th-2A-03] Split C-V Measurements for the Separate Extraction of Interface Trap Density and Fixed Charge in (0001) 4H-SiC MOSFETs

*Shane Stein¹, Daniel Lichtenwalner¹, Sei-Hyung Ryu¹ (1. Wolfspeed (USA))