Presentation Information

[Th-2A-04]Decoupling Effective Field, Screening, and Temperature Dependencies of Inversion Layer Mobility in SiC MOSFETs: Physical Insight into Dominant Scattering Mechanisms

*Tetsuo Hatakeyama1, Hirohisa Hirai2, Mitsuru Sometani2, Mitsuo Okamoto2, Shinsuke Harada2 (1. Toyama Prefectural Univ. (Japan), 2. AIST (Japan))