Presentation Information
[Th-P-07]Capacitive response of deep traps in implanted p-MOS by frequency-dependent and quasi-static measurements at low temperature or under UV illumination
Marco Zignale1, *Patrick Fiorenza1, Valeria Puglisi2, Paola Mancuso2, Simone Rascunà2, Mario Saggio2, Marilena Vivona1, Filippo Giannazzo1, Fabrizio Roccaforte1 (1. CNR-IMM (Italy), 2. STMicroelectronics (Italy))