Presentation Information

[Th-P-11]Structural and Electrical Characterization of He Ion Implanted 4H-SiC

*Ben J. Sekely1, Cory D. Cress1, Jeffery M. Woodward1, Daniel J. Pennachio1, Ignas Lekavicius1, Jenifer R. Hajzus1, Rachael L. Myers-Ward1 (1. U.S. Naval Research Lab. (USA))