Presentation Information

[Th-P-54]Comparison of Ruggedness of Surge-, Unclamped Inductive Switching- and Short Circuit-Stress in 4H-SiC MOSFETs

*Philipp Steinmann1, Ramona Buckreus1, Sabrina Ulmer1, Tugrul Sahin1 (1. Robert Bosch GmbH (Germany))