Presentation Information
[Tu-P-50]Impact of micro-pits defects on the low temperature electrical characteristics of 650 V 4H-SiC power MOSFETs
*Marco Zignale1, Patrick Fiorenza1, Salvatore Ethan Panasci1, Alberto Catena2, Francesco Maria Fiorino2, Filippo Giannazzo1, Fabrizio Roccaforte1 (1. CNR-IMM (Italy), 2. STMicroelectronics (Italy))
