Presentation Information

[Tu-P-55]Short-Circuit and Surge-Current Robustness Limit of SiC MOSFETs at Negative and Elevated Temperatures

*Mohamed Alaluss1, Madhu Lakshman Mysore1, Maximilian Goller1, Josef Lutz1, Thomas Basler1 (1. Chemnitz Univ. of Tech. (Germany))