Presentation Information

[Tu-P-59]Investigation of the Short-Circuit Failure Mechanisms in 1700 V 4H-SiC VDMOSFETs

*Yu-Jen Chen1, Shih-Chiang Shen1, Chih-Ming Tzeng1, Chih-Ming Lai1 (1. Indus. Tech. Res. Inst. (Taiwan))