ICSCRM2026
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[Tu-P-59]
Investigation of the Short-Circuit Failure Mechanisms in 1700 V 4H-SiC VDMOSFETs
*Yu-Jen Chen
1
, Shih-Chiang Shen
1
, Chih-Ming Tzeng
1
, Chih-Ming Lai
1
(1. Indus. Tech. Res. Inst. (Taiwan))
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