Presentation Information
[Tu-P-70]Device-to-Circuit Stability of SiC CMOS Current Mirrors Under 15 MeV Proton Irradiation and 180 °C Operation
Tae Seong Kwon1,2, Young Jo Kim1, Hyoung Woo Kim1, Young Jun Yoon3, Sung Yun Woo2, *Jae Hwa Seo1 (1. Korea Electrotechnology Res. Inst. (Korea), 2. Kyungpook National Univ. (Korea), 3. Gyeongkuk National Univ. (Korea))