[Tu-P] Poster Session

[Tu-P-80] Revealing AC-BTI Mechanisms in SiC MOSFETs through Bias-, Geometry-, and Process-Dependent Characterization

*Jack Chien¹, Weijie Wang¹, Zijie Zheng^1,2, Xiaolin Wang^1,2, Leming Jiao^1,2, Runze Wang¹, Abdul Hannan Yeo¹, Qin Gui Roth Voo¹, Liyuan Liu¹, Xinghua Wang¹, Umesh Chand¹, Xiao Gong^1,2, Navab Singh¹, Yee Chia Yeo^1,2 (1. Inst. of Microelectronics (IME), A*STAR (Singapore), 2. National Univ. of Singapore (Singapore))