Presentation Information
[Tu-P-85]Application-Oriented Half-Bridge Testing Platform for Chip-Level Reliability Assessment in SiC Power Semiconductors
*Lorenzo Rocchino1, Hua Shen1, Francesco Iannuzzo2, Lucas Radon1, Jon Elipe-Fonollosa1, Edoardo Martino1 (1. Hitachi Energy Ltd. (Switzerland), 2. Politecnico di Torino (Italy))
