Presentation Information
[Tu-P-87LN]Thermal-Response PL/TR-PL Fingerprinting of B/Al-Dependent Lifetime Stability in n-Type 4H-SiC Wafers
*Rio Kishimoto1, Koji Ashida2, Daichi Dojima2, Hiroshi Mihara2, Tadaaki Kaneko1,2 (1. Kwansei Gakuin Univ. (Japan), 2. QureDA Research, Inc. (Japan))