[We-1A] Robustness

8:40 AM - 9:00 AM JST(11:40 PM - 12:00 AM UTC)

[We-1A-01] Influence of Cell Design on Short-Circuit Robustness of SiC MOSFETs with Measurements and Simulations

*Madhu Lakshman Mysore¹, Rahul Vijaybhai Chavda¹, Josef Lutz¹, Thomas Basler¹ (1. Chemnitz University of Technology (Germany))