Presentation Information

[We-2A-03]Impact of Distributed Gate Resistance on Switching Dynamics in a Segmented 4H-SiC MOSFET Model

*Jae-Hyung Jeremiah Park1, Arman Rashid1, Toby Schaffer1, Jeff Joohyung Kim1, Sei-Hyung Ryu1 (1. Wolfspeed Inc. (USA))