Presentation Information

[We-2A-06LN]Transition of Mobility-Limiting Mechanism from Trench to Fin MOS Channels Observed by Systematic Scaling in 4H-SiC FinFETs

*Tomoka Suematsu1,2,3, Hirohisa Hirai1, Mitsuru Sometani1, Mitsuo Okamoto1, Shinsuke Harada1, Haruka Shimizu2, Naoki Watanabe2, Yuki Mori2, Akio Shima2, Tsunenobu Kimoto3 (1. National Institute of Advanced Industrial Science and Technology (Japan), 2. Hitachi, Ltd. (Japan), 3. Kyoto Univ. (Japan))