Presentation Information

[We-2B-03]Atomic and Electronic View of Stacking Fault Expansion and Its Suppression Recipes in 4H-SiC

*Kenji Shiraishi2,6, Masaki Sano1, Yuansheng Zhao2,3,4, Takashi Yoda5, Takayuki Oba5, Jun Kojima2, Shoichi Onda2, Atsushi Oshiyama2,6 (1. Graduate School of Engineering, Nagoya University (Japan), 2. Institute of Materials and Systems for Sustainability, Nagoya University (Japan), 3. Quemix Inc. (Japan), 4. Department of Physics, The University of Tokyo (Japan), 5. WOW Alliance, Institute of Science Tokyo (Japan), 6. Center for Innovative Integrated Electronic Systems, Tohoku University (Japan))