[We-2B] Stacking Fault Expansion

11:50 AM - 12:10 PM JST(2:50 AM - 3:10 AM UTC)

[We-2B-04] Characterization of Triangular Defect Stacking Faults in 180 um Thick SiC Epitaxial Layers

*Alecsander Imhof¹, Nadeemullah Mahadik², Shanthi Subramanian³, Srujana Prayakarao³, Dong Lee³ (1. NRC Post Doc at U.S. Naval Res. Lab. (USA), 2. U.S. Naval Res. Lab. (USA), 3. Coherent Corp. (USA))