Presentation Information
[We-P-25]Investigation of Electro-Thermal TDDB Degradation in 1.2 kV SiC MOSFETs
*Ahmed A. Ibrahim1, Mohammad Monfared1, Saeed Jahdi2, Mohamed Amer Karout3, Craig Fisher1, Mike Jennings1 (1. Swansea Univ. (UK), 2. Univ. of Bristol (UK), 3. Univ. of Warwick (UK))