[We-P] Poster Session

[We-P-32] Crystal-Orientation-Dependent Electrical Characteristics and Bias-Stress Reliability of 4H-SiC Trench MOSFETs

*Zijie Zheng^1,2, Yu-Chieh Chien¹, Xiaolin Wang^1,2, Leming Jiao^1,2, Runze Wang¹, Liyuan Liu¹, Weijie Wang¹, Xinghua Wang¹, Abdul Hannan Yeo¹, Qin Gui Voo¹, Umesh Chand¹, Xiao Gong^1,2, Navab Singh¹, Yee Chia Yeo^1,2 (1. Agency for Sci., Tech. and Res. (Singapore), 2. National Univ. of Singapore (Singapore))