Presentation Information

[We-P-49]Focused Ion Beam Nanopillar Milling to Enhance Light Collection Efficiency from Color Centers in 4H-SiC

*Efe Eden1, Helton Goncalves de Medeiros1, Sarah Sofia Saldanha Faria1, Joakim Reuteler2, Ulrike Grossner1 (1. APS - ETH Zurich (Switzerland), 2. ScopeM - ETH Zurich (Switzerland))