Presentation Information
[We-P-57]Significant Reduction of Crystallographic Defects in 8-inch 4H-SiC Crystals via Optimization of Seed-Adhesion Interface Structure
*SUHO KIM1, Jung Gyu Kim1, Myung Ok Kyun1, Yeon Suk Jang1, Kap Ryeol Ku1, Jung Gon Kim2, Gwang Hee Jung2, Won Jae Lee2 (1. EINCRYSTAL Co.,Ltd. (Korea), 2. Univ. of Dong-Eui (Korea))