Presentation Information
[We-P-69]Unveiling a New Class of Triangular Defects in 4H-SiC Through Multi Scale Analysis
*Cristiano Calabretta1, Beatrice Carbone1, Corrado Bongiorno2, Nicolò Piluso1, Cettina Bottari1, Fabiana Vento1, Giuseppe Arena1, Mario Santi Alessandrino1, Andrea Severino1 (1. Indus. STMICROELECTRONICS (Italy), 2. Inst. CNR-IMM (Italy))