[We-P] Poster Session

[We-P-83] Deep-Level Characterization of Electron-Irradiated Diamond Device Using Alpha-Particle Charge Transient Spectroscopy

shin-ichiro Sato¹, *Naoya Iwamoto², Yuji Sone¹, Tsubasa Matsumoto³ (1. National Institutes for Quantum Science and Technology (Japan), 2. National Institute of Technology, Kagawa College (Japan), 3. Kanazawa University (Japan))