Presentation Information
[We-P-85]Quantitative Ab Initio Determination of Interface State Density Induced by Carbon Defects at SiC/SiO2 Interfaces
Yu Zhou1, Gunnar Russberg2, *Giovanni Alfieri3, Emil Håkansson2 (1. Hitachi Energy (China) Ltd. (China), 2. Hitachi Energy Sweden AB (Sweden), 3. Hitachi Energy Ltd. (Switzerland))