Presentation Information
[OLED6-3(Invited)]AI-Enabled High-Throughput Analysis for OLED Materials Optimization
*Wei Xu1, Han Chen1, Zeming Xia2, Ruifeng He2, Lan Ma1, Jingyao Song2 (1. TCL AI Lab (Hong Kong), 2. Guangzhou China Ray Optoelectronic Materials Co. Ltd. (China))
Keywords:
AI,OLED,High-Throughput Analysis,Materials Optimization,Graph Neural Network
Password required to view
To view or download the proceedings, please log into your A-Pass using the "Log in" button.
If you do not have a A-Pass, enter the password provided by the IDW Secretariat in the designated box and click the "Authenticate" button.
If you do not have a A-Pass, enter the password provided by the IDW Secretariat in the designated box and click the "Authenticate" button.
Log in
or
Comment
To browse or post comments, you must log in.Log in