Presentation Information
[AMDp1-14]Electrical Drift and Recovery in a-Si TFTs under Thermal Stress: Impact of Electrodes and LC Removal
*Feng Liu1, Xingda Xia1, Tianjiao Liu1, Tenghui He1, Wenzhang Zhao1, Junce Wang1, Wei Chen1, Hui Qiu1, Zuojia Xiang1, Qiyu Shen1, Chen i Huang1, James Hsu1, Wade Chen1 (1. Changsha HKC Optoelectronics Technology Co., Ltd. (China))
Keywords:
amorphous silicon,threshold voltage,electron traps,liquid crystal
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