Presentation Information

[14]Electrical Drift and Recovery in a-Si TFTs under Thermal Stress: Impact of Electrodes and LC Removal

*Feng Liu1, Xingda Xia1, Tianjiao Liu1, Tenghui He1, Qiyu Shen1, Chen i Huang1, James Hsu1, Wade Chen1 (1. Changsha HKC Optoelectronics technology Co., Ltd. (China))

Keywords:

amorphous silicon,threshold voltage,electron traps,liquid crystal


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