Presentation Information
[AMDp1-17]Design of a-Si TFT for Improvement of Leakage Current
*Xiao-Jie Wang1 (1. Chuzhou HKC Optoelectronics Technology Co. Ltd. (China))
Keywords:
A-si TFT,Chamfer,boundary,leakage current
Password required to view
To view or download the proceedings, please log into your A-Pass using the "Log in" button.
If you do not have a A-Pass, enter the password provided by the IDW Secretariat in the designated box and click the "Authenticate" button.
If you do not have a A-Pass, enter the password provided by the IDW Secretariat in the designated box and click the "Authenticate" button.
Log in
or
Comment
To browse or post comments, you must log in.Log in
