Presentation Information
[18]Study on the Stability of IGZO Thin Film Transistors under AC Stress
*Ting Chen1, Zhe Chen1, Yongzhao Liu1, Chenghao Bu1, Jinjin Yang1 (1. Tianma Microelectronics Co., Ltd. (China))
Keywords:
IGZO,AC stress,Impulse Voltage test,Vth shift
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