Presentation Information

[18]Study on the Stability of IGZO Thin Film Transistors under AC Stress

*Ting Chen1, Zhe Chen1, Yongzhao Liu1, Chenghao Bu1, Jinjin Yang1 (1. Tianma Microelectronics Co., Ltd. (China))

Keywords:

IGZO,AC stress,Impulse Voltage test,Vth shift


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