Presentation Information
[AMDp1-24L]Threshold Voltage Recovery and Leakage Suppression in IGTO TFTs under Drain Bias and Illumination Stress
*Bu Yong Choi1, Byoung Deog Choi1 (1. Sungkyunkwan University (Korea))
Keywords:
Oxide TFT,Photo charge trap,Hot carrier effects,Drain bias stress,Leakage suppression
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