Presentation Information

[AMDp1-25L]Investigation of Atmosphere- and Temperature-Dependent Trends in IGZO TFTs via Two-Step RTA/Furnace Annealing

*Seyepng Yoo1,2, Byoung-Deog Choi1 (1. Sungkyunkwan University (Korea), 2. Samsung Institution of Technology (Korea))

Keywords:

IGZO,Oxide Semiconductor,TFT,Anneal


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