Presentation Information
[AMDp1-26L]Bias Stability Evaluation of Amorphous IGZO Thin-Film Transistors using Al2O3 Passivation Layers
*Jayeong Jin1, Han Byul So1, Hyung Koun Cho1 (1. Sungkyunkwan University (Korea))
Keywords:
a-IGZO,Thin-film transistor(TFT),,Electrical property,Passivation,Negative Bias Stress(NBS)
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