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Bias Stability Evaluation of Amorphous IGZO Thin-Film Transistors using Al2O3 Passivation Layers

Active-Matrix Device

The 32nd International Display Workshops (IDW '25)

Presentation Information

[AMDp1-26L]Bias Stability Evaluation of Amorphous IGZO Thin-Film Transistors using Al₂O₃ Passivation Layers

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Presentation Information

[AMDp1-26L]Bias Stability Evaluation of Amorphous IGZO Thin-Film Transistors using Al2O3 Passivation Layers

Keywords:

Comment

[AMDp1-26L]Bias Stability Evaluation of Amorphous IGZO Thin-Film Transistors using Al₂O₃ Passivation Layers