Presentation Information
[5]Cause Analysis of Bubble Formation in TFT-LCD Products after High-Reliability Ball Drop Test
*Xianfei Zhu1, Zeyao Li1, Xiaowu Sun1, Xirong Han1, Tianhao Zhang1, Jianyu Cui1, Tian Lan1, Ying Ye1, Maokun Yang1, Minghong Shi1, Wade Chen1 (1. Chongqing HKC Optoelectronics Technology Co. Ltd. (China))
Keywords:
LCD,Bubble,CF-ITO,FIB
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