Presentation Information
[OLEDp1-3]A Quantitative Measurement and Evaluation Scheme for Mura of OLEDoS with CRA
*Chao Pu1, Yinhu Huang1, Pengcheng Lu1, Shucheng Yang1, Zhao Ma1, Yingbing Zhang1, Lida Li1, Dongjin Shi1, Zhuoyang Xie1, Yi Wang1, Xiufang Wang1 (1. Yunnan Invensight Optoelectronics Technology Co., LTD. (China))
Keywords:
Measurement and Evaluation Scheme,Mura,OLEDoS,CRA
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