Presentation Information
[15]Electrical Test Methodology for a-Si TFTs in LCD Panels
*Feng Liu1, Xingda Xia1, Junce Wang1, Kang Long1, Qiyu Shen1, Shiwei Kong1, chen i Huang1, James Hsu1, Wade Chen1 (1. ChangSha HKC (China))
Keywords:
amorphous silicon,Electrical Characterization,Leakage,liquid crystal
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