Session Details
[AMDp1]Active-Matrix Device
Wed. Dec 2, 2026 2:50 PM - 4:20 PM JST
Wed. Dec 2, 2026 5:50 AM - 7:20 AM UTC
Wed. Dec 2, 2026 5:50 AM - 7:20 AM UTC
Exhibition and Event Hall (Poster-1)(1st Floor)
[1]Performance Enhancement of IGZO/ITO Heterojunction Thin-Film Transistors via Oxygen-Controlled Interfacial Engineering
*Suji Choi1, Seungwoo Chu1, Ire Oh1, Sangmin Hong1, Seungmin Lee1, Junsu Nam1, Junsin Yi1 (1. Sungkyunkwan University (Korea))
[2]WTe2 van der Waals Contacts for Barrier-Free p-Type TMD Transistors
*Kyoungmin Kim1, Jungwoo Bong1, Soheil Ghods1, Jae-Hyun Lee1 (1. Sungkyunkwan University (Korea))
[3]Stability Enhancement of a-IGZO Thin-Film Transistors through H2 Plasma Treatment and Post Annealing
*Taeyang Kim1, Hyeonjeong Sun1, Seungmin Choi1, Seungjae Lee1, Yeoeun Yun1, Suhwon Choi1, Heesun Lim1, Seung-Beck Lee1 (1. Hanyang University (Korea))
[4]Promoter-Free Wafer-Scale Monolayer MoS2 for Logic Devices and Broadband Photodetectors
*Jungwoo Bong1, Keun Heo2, Jae-Hyun Lee1 (1. Sungkyunkwan University (Korea), 2. Jeonbuk National University (Korea))
[5]P-Type LTPS TFT-Based Multi-Emission PWM Micro-LED Pixel Circuit Featuring a Flicker-Prevention Mechanism
*Yu-Chang Chiu1, Cheng-Rui Lu1, Ting-Wei Kuo1, Chia-Lun Lee2, Chih-Lung Lin1 (1. National Cheng Kung University (Taiwan), 2. AUO Corporation (Taiwan))
[6]Improving the Uniformity of Electrical Characteristics in IGZO TFTs by Optimizing Boron Implantation Process
*Si Fu1, Wei Wang1, Xingyu Zhou1, Yanqing Guan1, Xiaoguang Zhu1, Chao Dai1, Juncheng Xiao1 (1. Wuhan China Star Optoelectronics.Semiconductor Display Technology Co., Ltd (China))
[7]The Strategy for Reducing the O-cut Mura Defect Rate in 8T2C LTPO Products
*Xiaolei Zhang1, Huanxi Zhang1, Huihui Song1, Shanglong Wang1, Xiaoxia Zhang1, Yanqing Guan1, Zuomin Liao1, Juncheng Xiao1, Chao Dai1 (1. Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd. (China))
[8]Optimization of Sputtered Ga2O3 Passivation Conditions for a-IGZO TFT Bias Stress Stability
*Suhwon Choi1, Hyeonjeong Sun1, Seungmin Choi1, Seungjae Lee1, Yeoeun Yun1, Taeyang Kim1, Heesun Lim1, Seung-Beck Lee1 (1. Hanyang University (Korea))
[9]Reliability Improvement of IGZO TFTs through Hydrogen Control in SiNx Gate Insulators via N2 and NO Plasma Treatments with Low Temperature Annealing
*Seungmin Lee1, Junsin Yi1 (1. Sungkyunkwan University (Korea))
[10]Enhanced PBTS Reliability in LTPS-TFTs through Etch Taper Angle Optimization
*Xinjie Peng1 (1. Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd. (China))
[11]A-Si LCD Panel with 2.6mm Narrow Down Border
*Xuexin Lan1, Chunrong Lin1, Lihua Zheng1, Yuanyuan Zhong1, Fushan Dai1, Yanshan Huang1, Jiancai Huang1, Dandan Qin1, Xianyan Yang1 (1. Xiamen Tianma Optoelectronics Co., Ltd. (China))
[12]Multi-dimensional Analysis and Optimization of Dark Array Mura Caused by TFT-LCD Metal Etching Profile Abnormality
*Guanghui Cao1, Fada Shi1, Xin Liu1, Jiaming Xu1, Bing LI1, Hongyan Chang1, Shishuai Huang1, Bing Han1, Paul Shi1, Wade Chen1 (1. ChuZhou HKC Optoelectronics Technology Co., Ltd (China))
[13]Thermal Management for High-Refresh-Rate Narrow-Border LCD Panels
*Ying Ye1, Zeyao Li1, Yuanguo Tan1, Xirong Han1, Jianyu Cui1, Xianfei Zhu1, Tian Lan1, Menglin Yang1, Xinxin Yang1, Maokun Yang1, Tao Qu1, Zhaoxuan Zhu1, Ya Hu1, Minghong Shi1, Wade Chen1 (1. Chongqing HKC Optoelectronics Technology Co. Ltd (China))
[14]Feasibility Study on Transferring TFT-LCD Positive PFA Photoresist Exposure and Development from Projection to Proximity Lithography Systems
*Kang Long1, Hua Hui Liao1, Feng Liu1, Hui Teng He1, Qing Jiang1, Hui Zhi Song1, Huang Chen I1, James Hsu1, Wade Chen1 (1. Changsha HKC (China))
[15]Electrical Test Methodology for a-Si TFTs in LCD Panels
*Feng Liu1, Xingda Xia1, Junce Wang1, Kang Long1, Qiyu Shen1, Shiwei Kong1, chen i Huang1, James Hsu1, Wade Chen1 (1. ChangSha HKC (China))
[16]Investigation of Titanium Residue and Aluminum Corrosion during Dry Etching of Ti/Al/Ti Stacks on Photosensitive Polyimide (PSPI) Films
*Shengrong Yu1, Zhonghuan Cao1, Can Zhu1, Sirui Jiang1, Ding Ding1, Guoqiang Yang1, Chao Dai1, Juncheng Xiao1 (1. Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd. (China))
[17]Research on Optimizing Array Fabrication Process to Refining Groove Morphology
*Qizhi Dong1, Xinyi Luo1, Guoqiang Yang1, Yanqing Guan1, Chao Dai1, Juncheng Xiao1 (1. Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd. (China))
[18]A TCAD-Based Comparative Study of SiO2/SiNx Stacked Gate Dielectric for Enhanced Performance and Reliability in LTPS-TFTs
*Yunfan Shi1, Huichen Xie1, Xingyu Zhou1, Yanqing Guan1, Chao Dai1, Juncheng Xiao1 (1. Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd. (China))
[19]Research on Ultra-Wide Flicker-Free Hybrid Dimming for 1 Hz OLED Panels in Laptops
*Y L W1 (1. CSOT (China))