Presentation Information
[16]Investigation of Titanium Residue and Aluminum Corrosion during Dry Etching of Ti/Al/Ti Stacks on Photosensitive Polyimide (PSPI) Films
*Shengrong Yu1, Zhonghuan Cao1, Can Zhu1, Sirui Jiang1, Ding Ding1, Guoqiang Yang1, Chao Dai1, Juncheng Xiao1 (1. Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd. (China))
Keywords:
OELD,PSPI,Ti Residual and Al Corrosion
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