Presentation Information

[O1-7-02]Characterization of 3.3 kV SiC Switches: Short-Circuit Robustness of Uni-directional MOSFETs and Switching Performance of Monolithic BiDFETs

Qihao Luo1, Pengyu Fu1, Juchen Yang1, Euler Valdivieso1, Yizhou Cong1, Zhining Zhang1, *Jin Wang1, Anant Agarwal1, Ajit Kanale2, Ashish Kumar2, Stanley Atcitty3 (1. The Ohio State University (USA), 2. Wolfspeed, Inc. (USA), 3. Sandia National Laboratories (USA))

Keywords:

silicon carbide,medium voltage,BiDFET,short circuit withstand time