[O2-5] Wide-Bandgap Power Devices Gate Driving and Reliability

2:50 PM - 3:10 PM JST(5:50 AM - 6:10 AM UTC)

[O2-5-02] Implementation of Gate Oscillation Suppression Method that Does Not Deteriorate Switching Characteristics

*Ryoga KIGUCHI¹, Hiromu TAKUBO¹, Masakazu GEKINOZU¹ (1. Fuji Electric Co., Ltd. (Japan))

Keywords:

Gate Oscillation,SiC-MOSFET,Device Modeling,Gate Drive Circuit,Equivalent Circuit,Gate Driver