[O2-7] Reliability of Passive Components and Power Semiconductor Devices

2:30 PM - 2:50 PM JST(5:30 AM - 5:50 AM UTC)

[O2-7-01] Application-oriented capacitor testing method with realistic electro-thermal stress emulation

*Bo Yao¹, Zhaoxin Wang¹, Xing Wei¹, Yichi Zhang¹, Lei Qi², Huai Wang¹ (1. Aalborg university (Denmark), 2. North China Electric Power University (China))

Keywords:

Capacitors,Reliability,Stress test