[O2-7] Reliability of Passive Components and Power Semiconductor Devices | IPEC2026

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Session Details

Organized SessionSemiconductor Power Conversion

[O2-7]Reliability of Passive Components and Power Semiconductor Devices

Mon. Jun 1, 2026 2:30 PM - 4:10 PM JST
Mon. Jun 1, 2026 5:30 AM - 7:10 AM UTC

Room 108(1F)

Chair:Kazunori Hasegawa(Kyushu Institute of Technology)

2:30 PM - 2:50 PM JST(5:30 AM - 5:50 AM UTC)

[O2-7-01]Application-oriented capacitor testing method with realistic electro-thermal stress emulation

*Bo Yao¹, Zhaoxin Wang¹, Xing Wei¹, Yichi Zhang¹, Lei Qi², Huai Wang¹ (1. Aalborg university (Denmark), 2. North China Electric Power University (China))

2:50 PM - 3:10 PM JST(5:50 AM - 6:10 AM UTC)

[O2-7-02]Impedance monitoring method of a DC-link capacitor in a V2X EV charger with three bidirectional converters

*Tomoyuki Nagano^1,2, Kazunori Hasegawa², Shigeki Yamate¹, Atsushi Tokii¹ (1. GS Yuasa International Ltd. (Japan), 2. Kyushu Institute of Technology (Japan))

3:10 PM - 3:30 PM JST(6:10 AM - 6:30 AM UTC)

[O2-7-03]EMC: a Limiting Factor of WBG Power Electronics Development ?

*Jean-Luc Schanen¹, Genevieve Frantz¹ (1. Univ. Grenoble Alpes, CNRS, Grenoble INP, G2Elab (France))

3:30 PM - 3:50 PM JST(6:30 AM - 6:50 AM UTC)

[O2-7-04]A Novel Method for Compensating the Parastic Oscillation of Conduction Voltage Drop in IGBT Modules

*Lele Wei¹, Shuangzhe Chen¹, Dangsheng Zhou², Sufei Wang², Tianhao Wu², Ke Ma¹ (1. School of Electrical Engineering, Shanghai Jiao Tong University (China), 2. R&D Center Shenzhen Hopewind Electric Co., Ltd., Shenzhen (China))

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