[O3-3] Reliability and Lifetime Assessment of Semiconductor Devices

4:50 PM - 5:10 PM JST(7:50 AM - 8:10 AM UTC)

[O3-3-02] Lifetime Predictive Model of SiC MOSFETs using Neural Network for Condition Monitoring Application

*KIATTISAK TONGON¹, Surin Khomfoi¹ (1. King Mongkut's Institute of Technology Ladkrabang (Thailand))

Keywords:

SiC MOSFETs,thermal modeling,LSTM,condition monitoring