[O3-3] Reliability and Lifetime Assessment of Semiconductor Devices | IPEC2026

Session Details

Regular SessionSemiconductor Power Conversion : Emerging technologies in Packaging, thermal management, system integration and Reliability (Advanced fault protection systems, Diagnostics)

[O3-3]Reliability and Lifetime Assessment of Semiconductor Devices

Mon. Jun 1, 2026 4:30 PM - 6:10 PM JST
Mon. Jun 1, 2026 7:30 AM - 9:10 AM UTC

Room 101C(1F)

Chair:Homer Alan Mantooth(University of Arkansas), Kazunori Hasegawa(Kyushu Institute of Technology)

4:30 PM - 4:50 PM JST(7:30 AM - 7:50 AM UTC)

[O3-3-01]Predicting the switching lifetime of GaN HEMTs in LLC converters and Totem-Pole PFCs

*Hiroshi Yamashita¹, Hirokazu Oki¹, Toshiyuki Zaitsu¹ (1. ROHM Co., Ltd. (Japan))

4:50 PM - 5:10 PM JST(7:50 AM - 8:10 AM UTC)

[O3-3-02]Lifetime Predictive Model of SiC MOSFETs using Neural Network for Condition Monitoring Application

*KIATTISAK TONGON¹, Surin Khomfoi¹ (1. King Mongkut's Institute of Technology Ladkrabang (Thailand))

5:10 PM - 5:30 PM JST(8:10 AM - 8:30 AM UTC)

[O3-3-03]Outlier Screening of Predicted Cycle Life for Lifetime Modeling in Power Cycling Tests of Power Semiconductor Devices

*Yichi Zhang¹, Yi Zhang², Bo Yao¹, Jiahong Liu¹, Frede Blaabjerg¹, Huai Wang¹ (1. Aalborg University (Denmark), 2. Hong Kong Polytechnic University (Hong Kong))

5:30 PM - 5:50 PM JST(8:30 AM - 8:50 AM UTC)

[O3-3-04]Comparative Life-Cycle Environmental Impact Analysis of L and LCL Filter Topologies for Three-Phase Inverters

Ning Wang¹, Chaochao Song¹, Fabio Sporchia¹, Massimo Pizzol¹, *Ariya Sangwongwanich¹ (1. Aalborg University (Denmark))

5:50 PM - 6:10 PM JST(8:50 AM - 9:10 AM UTC)

[O3-3-05]Components Degradation and Failure Interdependence in Power Electronics Converters

*Jinwoo Song¹, Claudia Fecarotti¹, Antonis Stathatos¹, Chengmin Li¹, Georgios Papafotiou¹ (1. Eindhoven University of Technology (Netherlands))

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