[O3-3] Reliability and Lifetime Assessment of Semiconductor Devices

5:10 PM - 5:30 PM JST(8:10 AM - 8:30 AM UTC)

[O3-3-03] Outlier Screening of Predicted Cycle Life for Lifetime Modeling in Power Cycling Tests of Power Semiconductor Devices

*Yichi Zhang¹, Yi Zhang², Bo Yao¹, Jiahong Liu¹, Frede Blaabjerg¹, Huai Wang¹ (1. Aalborg University (Denmark), 2. Hong Kong Polytechnic University (Hong Kong))

Keywords:

Cycle life prediction,lifetime model,outlier detection,power cycling test