[O3-3] Reliability and Lifetime Assessment of Semiconductor Devices

5:50 PM - 6:10 PM JST(8:50 AM - 9:10 AM UTC)

[O3-3-05] Components Degradation and Failure Interdependence in Power Electronics Converters

*Jinwoo Song¹, Claudia Fecarotti¹, Antonis Stathatos¹, Chengmin Li¹, Georgios Papafotiou¹ (1. Eindhoven University of Technology (Netherlands))

Keywords:

Power electronic converters,Reliability,Failure dependencies,Predictive model