Presentation Information
[P2-10-09]Calorimetric-Based Condition Monitoring and Reliability Assessment of Power Semiconductor Devices in Electric Vehicle Inverters
*Shahriar Sarmast Ghahfarokhi1, Enes Ayaz1, Stanisław Oliszewski2, Staffan Norrga1, Hans Peter Nee1 (1. KTH Royal Institute of Technology (Sweden), 2. Wrocław University of Science and Technology (Poland))
Keywords:
SiC MOSFET,Calorimetry,Degradation,Reliability,Electric vehicle inverter
