[P2-3] Emerging technologies in Packaging, thermal management, system integration and reliability 2

[P2-3-01] Modular Accelerated Lifetime Testing Platform for Autonomous Testing of Multiple Proximal SiC MOSFETs to Inform Data-Driven RUL Estimation

Paul Bradford¹, *Hongjie Wang¹ (1. Utah State University (USA))

Keywords:

Accelerated Lifetime Testing,Reliability,Remaining Useful Lifetime,Silicon Carbide MOSFET